Analysis of the possibilities of a two-wire connection method for a resistive temperature sensor

Purpose of research. The widespread use of temperature measurement devices with resistive sensors connected via three-wire or four-wire configurations in industrial process control systems leads to increased complexity of cabling networks and switching components, and significantly limits the number of measurement channels per analog input module. A two-wire connection scheme, which minimizes these drawbacks, introduces significant measurement errors due to additional and unstable resistance from the connecting wires. This work investigates a method proposed by the authors for reducing the error introduced by the connecting line, based on estimating resistance from the integration of the capacitor discharge transient process across the sensor. The study evaluates the impact of quantization effects, noise, and integration intervals of the measurement circuit’s response on the accuracy of resistance determination.

Methods. The assessment of the factors was carried out through simulation in MATLAB and experimental validation of the proposed solution on a prototype model.

Results. A significant advantage of trapezoidal integration has been demonstrated, allowing for measurement errors more than 300 times smaller under experimental conditions compared to the left rectangle method. The optimal integration time was determined, which minimizes the influence of quantization noise and interference on measurement error across the sensor's resistance range. It was found that the optimal integration time is proportional to the resistance value of the sensor, and deviations from the optimal value by up to 50% result in only a minor increase in estimation error.

Conclusion. The measurement error of the resistive sensor's resistance using the proposed method under identical conditions is comparable to that of the method based on integrating the entire capacitor discharge transient process. The maximum error under experimental conditions does not exceed 0.12% when measuring a resistance of 2 kΩ, and is significantly lower for other values. At the same time, the proposed solution allows for a substantial increase in speed due to reduced integration time, and a reduction in equipment size by eliminating the need for a complex switch matrix in scanning systems.

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